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The atomic structure at the interface of CoSi$_2$ films on Si(111) has been investigated with x-ray standing waves. The Co atoms at the interface are five-fold-coordinated. The bonds across the interface are dilated by 0.05±0.03 Å. For the range of film thicknesses studied (9–28 Å), the CoSi$_2 $lattice was measured to be almost free of strain in the direction perpendicular to the interface plane

physical review. b, condensed matter

Structure determination of the<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">CoSi</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>:Si(111) interface by x-ray standing-wave analysis

Structure determination of theCoSi2:Si(111) interface by x-ray standing-wave analysis