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The stimulated emission of exciton-polaritons was proposed as a means oflowering the lasing threshold because it does not require the dissociation ofexcitons to obtain an electron-hole plasma, as in a classical semiconductorlaser based on population inversion. In this work we propose a method to proveunambiguously the polaritonic nature of lasing by combining experimentalmeasurements with a model accounting for the permittivity change as a functionof the carrier density. To do so we use angle resolved photoluminescence toobserve the lasing at cryogenic temperature from a polariton mode in a zincoxide waveguide structure, and to monitor the continuous shift of thepolaritonic dispersion towards a photonic dispersion as the optical intensityof the pump is increased (up to 20 times the one at threshold). This shift isreproduced thanks to a model taking into account the reduction of theoscillator strength and the renormalization of the bandgap due to the screeningof the electrostatic interaction between electrons and holes. Furthermore, themeasurement of the carriers lifetime at optical intensities in the order ofthose at which the polariton lasing occurs enables us to estimate the carrierdensity, confirming it is lower than the corresponding Mott density for zincoxide reported in the literature.

Lasing in a ZnO waveguide: clear evidence of polaritonic gain obtained by monitoring the continuous exciton screening