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We show in random matrix theory, microwave measurements, and computersimulations that the mean free path of a random medium and the strength andposition of an embedded reflector can be determined from radiation scattered bythe system. The mean free path and strength of the reflector are determinedfrom the statistics of transmission. The statistics of transmission areindependent of the position of the reflector. The reflector's position can befound, however, from the average dwell time for waves incident from one side ofthe sample.

Characterizing random 1D media with an embedded reflector via scattered waves