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Measuring ThermoRemanent Magnetization (TRM) decays on a single crystal CuMn(6$\%$) spin glass sample, we have systematically mapped the rapid decrease of the characteristic timescale $tw_{eff}$ near $T_g$. Using $tw_{eff}$ to determine the length scale of the growth of correlations during the waiting time, $\xi_{TRM}$, (observed in both numerical studies and experiment), we observe both growth of $\xi_{TRM}$ in the spin glass phase and then a rapid reduction very close to $T_g$. We interpret this reduction in $\xi_{TRM}$, for all waiting times, as being governed by the critical correlation length scale $\xi_{crit}=a(T-T_c)^{-\nu}$.

Experimental determination of the critical spin-glass correlation length in single-crystal CuMn