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Recent demonstrations of electrical detection and manipulation ofantiferromagnets (AFMs) have opened new opportunities towards robust andultrafast spintronics devices. However, it is difficult to establish theconnection between the spin-transport behavior and the microscopic AFM domainstates due to the lack of the real-time AFM domain imaging technique under theelectric field. Here we report a significant Voigt rotation up to 60 mdeg inthin NiO(001) films at room temperature. Such large Voigt rotation allows us todirectly observe AFM domains in thin-film NiO by utilizing a wide-field opticalmicroscope. Further complementary XMLD-PEEM measurement confirms that the Voigtcontrast originates from the NiO AFM order. We examine the domain patternevolution at a wide range of temperature and with the application of externalmagnetic field. Comparing to large-scale-facility techniques such as the X-rayphotoemission electron microscopy, the use with a wide-field, tabletop opticalimaging method enables straightforward access to domain configurations ofsingle-layer AFMs.

Imaging Antiferromagnetic Domains in Nickel-oxide Thin Films by Magneto-optical Voigt Effect