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We demonstrate the application of a fiber-coupled quantum-dot-in-a-tip as aprobe for scanning electric field microscopy. We map the out-of-plane componentof the electric field induced by a pair of electrodes by measurement of thequantum-confined Stark effect induced on a quantum dot spectral line. Ourresults are in agreement with finite element simulations of the experiment.Furthermore, we present results from analytic calculations and simulationswhich are relevant to any electric field sensor embedded in a dielectric tip.In particular, we highlight the impact of the tip geometry on both theresolution and sensitivity.

Electric field sensing with a scanning fiber-coupled quantum dot