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We study the key domain wall properties in segmented nanowires loop-basedstructures used in domain wall based sensors. The two reasons for devicefailure, namely the distribution of domain wall propagation field (depinning)and the nucleation field are determined with Magneto-Optical Kerr Effect (MOKE)and Giant Magnetoresistance (GMR) measurements for thousands of elements toobtain significant statistics. Single layers of Ni$_{81}$Fe$_{19}$, a completeGMR stack with Co$_{90}$Fe$_{10}$/Ni$_{81}$Fe$_{19}$ as a free layer and asingle layer of Co$_{90}$Fe$_{10}$ are deposited and industrially patterned todetermine the influence of the shape anisotropy, the magnetocrystallineanisotropy and the fabrication processes. We show that the propagation field islittle influenced by the geometry but significantly by material parameters. Thedomain wall nucleation fields can be described by a typical Stoner-Wohlfarthmodel related to the measured geometrical parameters of the wires and fitted byconsidering the process parameters. The GMR effect is subsequently measured ina substantial number of devices (3000), in order to accurately gauge thevariation between devices. This reveals a corrected upper limit to thenucleation fields of the sensors that can be exploited for fastcharacterization of working elements.

Geometrical dependence of domain wall propagation and nucleation fields in magnetic domain wall sensor devices