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In organic bulk heterojunction solar cells, the open circuit voltage($V_\mathrm{oc}$) suffers from an ultra-high loss at low temperatures. In thiswork we investigate the origin of the loss through calculating the$V_\mathrm{oc}-T$ plots with the device model method systematically andcomparing it with experimentally observed ones. When the energetic disorder isincorporated into the model by considering the disorder-suppressed andtemperature-dependent charge carrier mobilities, it is found that fornonselective contacts the $V_\mathrm{oc}$ reduces drastically under the lowtemperature regime, while for selective contacts the $V_\mathrm{oc}$ keepsincreasing with the decreasing temperature. The main reason is revealed that asthe temperature decreases, the reduced mobilities give rise to low chargeextraction efficiency and small bimolecular recombination rate for thephotogenerated charge carriers, so that in the former case they can beextracted from the wrong electrode to form a leakage current which counteractsthe photocurrent and increases quickly with voltage, leading to the anomalousreduction of $V_\mathrm{oc}$. In addition, it is revealed that the chargegeneration rate is slow-varying with temperature and does not inducesignificant $V_\mathrm{oc}$ loss. This work also provides a comprehensivepicture for the $V_\mathrm{oc}$ behavior under varying device workingconditions.

physical review applied

Energetic disorder induced leakage current in organic bulk  heterojunction solar cells: comprehending the ultra-high open circuit voltage  loss at low temperatures