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Ultrafast light-matter interaction has emerged as a powerful tool to controland probe the macroscopic properties of functional materials, especiallytwo-dimensional transition metal dichalcogenides which can form differentstructural phases with distinct physical properties. However, it is oftendifficult to accurately determine the transient optical constants. In thiswork, we developed a near-infrared pump - terahertz to midinfrared (12-22 THz)probe system in transmission geometry to measure the transient opticalconductivity in 2H-MoTe2 layered material. By performing separate measurementson bulk and thin-film samples, we are able to overcome issues related tononuniform substrate thickness and penetration depth mismatch and to extractthe transient optical constants reliably. Our results show that photoexcitationat 690 nm induces a transient insulator-metal transition, while photoexcitationat 2 um has a much smaller effect due to the photon energy being smaller thanthe band gap of the material. Combining this with a single-color pump-probemeasurement, we show that the transient response evolves towards 1T' phase athigher flunece. Our work provides a comprehensive understanding of thephotoinduced phase transition in the 2H-MoTe2 system.

Direct measurement of photoinduced transient conducting state in multilayer 2H-MoTe2