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Scanning superconducting quantum interference device (SQUID) microscopy is amagnetic imaging technique combining high-field sensitivity withnanometer-scale spatial resolution. State-of-the-art SQUID-on-tip probes arenow playing an important role in mapping correlation phenomena, such assuperconductivity and magnetism, which have recently been observed intwo-dimensional van der Waals materials. Here, we demonstrate a scanning probethat combines the magnetic and thermal imaging provided by an on-tip SQUID withthe tip-sample distance control and topographic contrast of a non-contactatomic force microscope (AFM). We pattern the nanometer-scale SQUID, includingits weak-link Josephson junctions, via focused ion beam milling at the apex ofa cantilever coated with Nb, yielding a sensor with an effective diameter of365 nm, field sensitivity of 9.5 $\text{nT}/\sqrt{\text{Hz}}$ and thermalsensitivity of 620 $\text{nK}/\sqrt{\text{Hz}}$, operating in magnetic fieldsup to 1.0 T. The resulting SQUID-on-lever is a robust AFM-like scanning probethat expands the reach of sensitive nanometer-scale magnetic and thermalimaging beyond what is currently possible.

Magnetic, thermal, and topographic imaging with a nanometer-scale SQUID-on-cantilever scanning probe