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Photonic crystals (PCs) offer unique ways to control light-matterinteractions. The measurement of dispersion relations is a fundamentalprerequisite if we are to create novel functionalities in PC devices.Angle-resolved spectroscopic techniques are commonly used for characterizingPCs that work in the visible and near-infrared regions. However, the techniquescannot be applied to the mid- and long-wavelength infrared regions due to thelimited sensitivity of infrared detectors. Here, we propose an alternativeapproach to measuring infrared dispersion relations. We construct ahigh-precision angle-resolved setup compatible with a Fourier-transformspectrometer with an angle resolution as high as 0.3 degrees. Hence, thereflection spectra are mapped to the 2D photonic band structures ofIn(Ga,Al)As/InP based PC slabs, which are designed as mid-infrared PCsurface-emitting lasers. We identify complex PC modes with the aid ofpolarization selection rules derived by the group theory. Spectral analysismakes it possible to evaluate the mode quality (Q) factors. Therefore,angle-resolved reflection is a useful way of optimizing 2D PC parameters formid-infrared devices.

Mid-infrared dispersion relations in InP based photonic crystal slabs revealed by Fourier-transform angle-resolved reflection spectroscopy