English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

The physical origin of spectral shift of thermally generated surfacephonon-polariton (SPhP) resonance of a silicon carbide (SiC) bulk mediated by anon-resonant film is elucidated. The local density of electromagnetic states(LDOS) in a non-resonant intrinsic silicon (Si) film due to thermal emission bySiC, derived using fluctuational electrodynamics, exhibits a local maximum nearSPhP resonant frequency in addition to a lower frequency resonance generated bygap modes emerging in the vacuum gap separating the SiC and Si layers. Multiplereflections within the vacuum gap also induce a LDOS drop around SPhP resonantfrequency. As a result, depending on the film thickness to vacuum gap ratio andthe location where the LDOS is calculated in the film, the low-frequencyresonance can dominate the LDOS, such that SPhP resonance appears to beredshifted. A similar spectral behavior is observed on the monochromaticradiative heat flux absorbed by the Si film. It is shown that apparent spectral(red and blue) shift of SPhP resonance mediated by a non-resonant film isbounded by the transverse and longitudinal optical phonon frequencies of SiC.This work is of importance in applications involving dissimilar materials, suchas thermophotovoltaics and thermal rectification, where gap modes maysignificantly disrupt flux resonance. Gap modes may also be at the origin ofthe resonance redshift systematically observed in near-field thermalspectroscopy.

Apparent spectral shift of thermally generated surface phonon-polariton resonance mediated by a non-resonant film