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Ultrafast electron diffraction (UED) is a technique in which short-pulseelectron beams can probe the femtosecond-scale evolution of atomic structure inmatter driven far from equilibrium. As an accelerator physics challenge, UEDimposes stringent constraints on the brightness of the probe electron beam. Thelow normalized emittance employed in UED, often at the 10 nm scale and below,is particularly sensitive to both applied field aberrations and space chargeeffects. The role of aberrations is increasingly important in small probesystems that often feature multiple orders of magnitude variations in beam sizeduring transport. In this work, we report the correction of normal quadrupole,skew quadrupole, and sextupole aberrations via dedicated corrector elements inan ultrafast electron micro-diffraction beamline. To do this, we generateprecise 4-dimensional phase space maps of rf-compressed electron beams, andfind excellent agreement with aberration-free space charge simulations.Finally, we discuss the role a probe-forming aperture can play in improving thebrightness of bunches with appreciable space charge effects.

Four-Dimensional Emittance Measurements of Ultrafast Electron Diffraction Optics Corrected Up to Sextupole Order