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Characterization and control of the transverse phase space of high-brightnesselectron beams is required at free-electron lasers or electron diffractionexperiments for emittance measurement and beam optimization as well as atadvanced acceleration experiments. Dielectric laser accelerators or plasmaaccelerators with external injection indeed require beam sizes at the micronlevel and below. We present a method using nano-fabricated metallic wiresoriented at different angles to obtain projections of the transverse phasespace by scanning the wires through the beam and detecting the amount ofscattered particles. Performing this measurement at several locations along thewaist allows assessing the transverse distribution at different phase advances.By applying a novel tomographic algorithm the transverse phase space densitycan be reconstructed. Measurements at the ACHIP chamber at SwissFEL confirmthat the transverse phase space of micrometer-sized electron beams can bereliably characterized using this method.

Electron beam transverse phase space tomography using nanofabricated wire scanners with submicrometer resolution