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Measurements of transverse profiles using Ionization Profile Monitors (IPMs)for high brightness beams are affected by the electromagnetic field of thebeam. This interaction may cause a distortion of the measured profile shapedespite strong external magnetic field applied to impose limits on thetransverse movement of electrons. The mechanisms leading to this distortion arediscussed in detail. The distortion itself is described by means of analyticcalculations for simplified beam distributions and a full simulation model forrealistic distributions. Simple relation for minimum magnetic field scalingwith beam parameters for avoiding profile distortions is presented. Further,application of machine learning algorithms to the problem of reconstructing theactual beam profile from distorted measured profile is presented. The obtainedresults show good agreement for tests on simulation data. The performance ofthese algorithms indicate that they could be very useful for operations of IPMson high brightness beams or IPMs with weak magnetic field.

Space-charge distortion of transverse profiles measured by electron-based Ionization Profile Monitors and correction methods