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We describe an isoelectronic differential apparatus designed to observe theinfluence on the Casimir force of the Mott-Anderson metal-insulator transitionin doped semiconductors. Alternative theories of dispersion forces lead todifferent predictions for this effect. The investigation of this problem bystandard apparatus, based on absolute measurements of the Casimir force, isvery difficult because the effect is small in the region of sub-micronseparations, where the Casimir force can be measured precisely. Thedifferential apparatus described here is immune by design to several sources oferror that blur the interpretation of Casimir experiments, like electrostaticpatches, inaccurate determination of plates separation, surface roughness anderrors in the optical data. With the help of the proposed setup it should bepossible to establish conclusively which among the alternative theories of theCasimir effect for semiconducting test bodies is correct.

Apparatus to probe the influence on the Casimir effect of the Mott-Anderson metal-insulator transition in doped semiconductors