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We previously demonstrated near-field speckle scanning based x-ray imaging tobe an easy-to-implement phase sensing method capable of providing both highsensitivity and high resolution. Yet, this performance combination could onlybe achieved at the cost of a significant number of sample exposures and ofextensive data acquisition time, thus tempering its implementation fortomography applications. Herein, we show ways of drastically lowering thenumber of exposures for the speckle scanning method to become attractive forcomputed tomography (CT) imaging. As the method presented can cope with a highdivergence beam, it is also expected to attract the attention of the laboratorysources community.

Near-field speckle-scanning-based X-ray tomography