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M. Ilchen, T. Mazza, E. T. Karamatskos, D. Markellos, S. Bakhtiarzadeh, A. J. Rafipoor, T. J. Kelly, N. Walsh, J. T. Costello, P. O’Keeffe, N. Gerken, M. Martins, P. Lambropoulos, and M. Meyer European XFEL GmbH, Albert-Einstein-Ring 19, D-22761 Hamburg, Germany Stanford PULSE Institute, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA IESL-FORTH, P.O. Box 1527, and Physics Department, University of Crete, Heraklion, Crete 71110, Greece School of Physical Sciences and NCPST, Dublin City University, Dublin 9, Ireland CNR Istituto di Struttura della Materia, CP10, I-00016 Monterotondo Scalo, Italy Universität Hamburg, Institut für Experimentalphysik, Luruper Chaussee 149, 22761 Hamburg, Germany (Received 24 May 2016; published 18 July 2016)

Two-electron processes in multiple ionization under strong soft-x-ray radiation