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Streaked photoemission metrology allows the observation of an apparentrelative time delay between the detection of photoelectrons from differentinitial electronic states. This relative delay is obtained by recording thephotoelectron yield as a function of the delay between an ionizing ultrashortextended ultraviolet (XUV) pulse and a streaking infrared (IR) pulse.Theoretically, photoemission delays can be defined based on i) the phase shiftthe photoelectron wavefunction accumulates during the release and propagationof the photoelectron (``Wigner delay") and, alternatively, ii) the streakingtrace in the calculated photoemission spectrum (``streaking delay"). Weinvestigate the relation between Wigner and streaking delays in thephotoemission from atomic and solid-surface targets. For solid targets andassuming a vanishing IR-skin depth, both Wigner and streaking delays can beinterpreted as an average propagation time needed by photoelectrons to reachthe surface, while the two delays differ for non-vanishing skin depths. Foratomic targets, the difference between Wigner and streaking delays depends onthe range of the ionic potential.

Streaking and Wigner time delays in photoemission from atoms and surfaces