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A general scenario for electronic charge migration in finite samplesilluminated by an intense laser pulse is given. Microscopic calculations forneon clusters under strong short pulses as produced by X-ray free-electronlaser sources confirm this scenario and point to the prominent role of fieldionization by strong internal fields. The latter leads to the fast formation ofa core-shell system with an almost static core of screened ions while the outershell explodes. Substituting the shell ions with a different material such ashelium as a sacrificial layer leads to a substantial improvement of thediffraction image for the embedded cluster thus reducing the consequences ofradiation damage for coherent diffractive imaging.

Ionization and charge migration through strong internal fields in clusters exposed to intense X-ray pulses