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Recently W. J. Kim, M. Brown-Hayes, D. A. R. Dalvit, J. H. Brownell, and R.Onofrio [Phys. Rev. A, v.78, 036102(R) (2008)] performed electrostaticcalibrations for a plane plate above a centimeter-size spherical lens atseparations down to 20-30 nm and observed "anomalous behavior". It was foundthat the gradient of the electrostatic force does not depend on separation aspredicted on the basis of a pure Coulombian contribution. Some hypotheses whichcould potentially explain the deviation from the expected behavior wereconsidered, and qualitative arguments in favor of the influence of patchsurface potentials were presented. We demonstrate that for the large lenses atseparations of a few tens nanometers from the plate, the electrostatic forcelaw used by the authors is not applicable due to possible deviations of themechanically polished and ground lens surface from a perfect spherical shape. Amodel is proposed which explains the observed "anomalous behavior" using thestandard Coulombian force.

Comment on "Anomalies in electrostatic calibration for the measurement of the Casimir force in a sphere-plane geometry"