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A method for non-destructive characterization of a dipole trapped atomicsample is presented. It relies on a measurement of the phase-shift imposed bycold atoms on an optical pulse that propagates through a free spaceMach-Zehnder interferometer. Using this technique we are able to determine,with very good accuracy, relevant trap parameters such as the atomic sampletemperature, trap oscillation frequencies and loss rates. Another importantfeature is that our method is faster than conventional absorption orfluorescence techniques, allowing the combination of high-dynamical rangemeasurements and a reduced number of spontaneous emission events per atom.Comment: 9 pages, 6 figures, submitted to PR

Nondestructive interferometric characterization of an optical dipole trap