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The experimental investigation of the Casimir force between a largemetallized sphere and semiconductor plate is performed using an atomic forcemicroscope. Improved calibration and measurement procedures permitted reductionin the role of different uncertainties. Rigorous statistical procedures areapplied for the analysis of random, systematic and total experimental errors at95% confidence. The theoretical Casimir force is computed for semiconductorplates with different conductivity properties taking into account alltheoretical uncertainties discussed in literature. The comparison betweenexperiment and theory is done at both 95 and 70% confidence. It is demonstratedthat the theoretical results computed for the semiconductor plate used inexperiment are consistent with data. At the same time, theory describing adielectric plate is excluded by experiment at 70% confidence. Thus, the Casimirforce is proved to be sensitive to the conductivity properties ofsemiconductors.Comment: 25 pages, 8 figures, 4 table

Experimental test for the conductivity properties from the Casimir force between metal and semiconductor