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We demonstrate the use of a single trapped ion as a sensor to probeelectric-field noise from interchangeable test surfaces. As proof of principle,we measure the magnitude and distance dependence of electric-field noise fromtwo ion-trap-like samples with patterned Au electrodes. This trapped-ion sensorcould be combined with other surface characterization tools to help elucidatethe mechanisms that give rise to electric-field noise from ion-trap surfaces.Such noise presents a significant hurdle for performing large-scale trapped-ionquantum computations.

Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor