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When atoms or molecules are exposed to strong short-pulse infrared radiation,ionization as well as "frustrated tunneling ionization" (FTI) can occur, inwhich a portion of the almost ionized electrons recombine into the initialground or an excited bound state. We analyze the ellipticity dependence of therelative signals that are predicted in a single-active electron approximation(SAE), the validity of which is checked against a parameter-free multi-electron\hbox{$R$-matrix} (close-coupling) with time dependence approach. We find goodagreement between the results from both models, thereby providing confidence inthe SAE model potential to treat the process of interest. Comparison of therelative excitation probabilities found in our numerical calculations with thepredictions of Landsman {\it et al.}\ (New Journal of Physics {\bf 15} (2013)013001) and Zhao {\it et al.}\ (Optics Express {\bf 27} (2019) 21689) revealsgood agreement with the former for short pulses. For longer pulses, theellipticity dependence becomes wider than that obtained from the Landsman {\itet al.} formula, but we do not obtain the increase compared to linearlypolarized radiation predicted by Zhao {\it et al.}

Ellipticity Dependence of Excitation and Ionization of Argon Atoms by Short-Pulse Infrared Radiation