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A microwave kinetic inductance detector (MKID) is a cutting-edgesuperconducting detector. It comprises a resonator circuit constructed with asuperconducting film on a dielectric substrate. To expand its field ofapplication, it is important to establish a method to suppress the two-levelsystem (TLS) noise that is caused by the electric fluctuations between the twoenergy states at the surface of the substrate. The electric field density canbe decreased by expanding the strip width (S) and gap width from the groundplane (W) in the MKID circuit, allowing the suppression of TLS noise. However,this effect has not yet been confirmed for MKIDs made with niobium films onsilicon substrates. In this study, we demonstrate its effectiveness for suchMKIDs. We expanded the dimension of the circuit from (S, W) = (3.00 $\mu$m,4.00 $\mu$m) to (S, W) = (5.00 $\mu$m, 23.7 $\mu$m), and achieved an increasedsuppression of 5.5 dB in TLS noise.

Characterization of two-level system noise for microwave kinetic inductance detector comprising niobium film on silicon substrate