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The quantitative measurement of OVII line intensity is a powerful method forunderstanding the soft X-ray diffuse background. By systematically analyzingthe OVII line intensity in 145 high-latitude Suzaku/XIS observations, the fluxof OI fluorescent line in the XIS spectrum, contaminating the OVII line, isfound to have an increasing trend with time especially after 2011. For theseobservations, the OVII line intensity would be overestimated unless taking intoconsideration the OI fluorescent line contamination. Since the OI line emissionoriginates from solar X-rays, this increase suggests that incident solar X-raysat the OI fluorescence energy tend to be larger than the early phase of Suzakuobservations (2005 - 2010).

OI Fluorescent Line Contamination in Soft X-Ray Diffuse Background Obtained with Suzaku/XIS