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We performed two types of radiation testing on high-speed LSI chips to testtheir suitability for use in wideband observations by the Japanese next spaceVLBI mission, VSOP-2. In the total ionization dose experiment we monitoredautocorrelation spectra which were taken with irradiated LSI chips and thesource current at intervals up to 1,000 hours from the ionization dose, but wecould not see any change of these features for the chips irradiated with doserates expected in the VSOP-2 mission. In the single event effect experiment, wemonitored the cross correlation phase and power spectra between the data fromradiated and non-radiated devices, and the source current during theirradiation of heavy-ions. We observed a few tens of single event upsets asdiscrete delay jumps for each LSI. We estimated the occurrence rate of singleevents in space as between once a few days to once a month. No single eventlatch-up was seen in any of the LSIs. These results show that the tested LSIshave sufficient tolerance to the environment for space VLBI observations.

Radiation Testing of Consumer High-Speed LSI Chips for the Next Space VLBI Mission, VSOP-2