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We show that diffraction intensity into the First Order Laue Zone (FOLZ) of acrystal can have a strong azimuthal dependence, where this FOLZ ring appearssolely because of unidirectional atom position modulation. Such a modulationwas already known to cause the appearance of elliptical columns in atomresolution images, but we show that measurement of the angle via 4-dimensionalScanning Transmission Electron Microscopy (4DSTEM) is far more reliable andallows the measurement of the modulation direction with a precision of about1{\deg} and an accuracy of about 3{\deg}. This method could be very powerful incharacterising atomic structures in 3 dimensions by 4DSTEM, especially in caseswhere the structure deviates from that found in bulk crystals.

Measurement of atomic modulation direction using the azimuthal variation of first order Laue zone electron diffraction