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Identification of compounds in mixtures of environmental contaminants or synthetic products is essential for regulatory analyses. Exact masses of ions determined by high resolution mass spectrometry provide unique elemental compositions only for low-mass ions (&amp;lt;150 Da). Using mass peak profiling from selected-ion recording data (MPPSIRD) to acquire additional mass spectral data and a profile generation model (PGM) for automated interpretation of the data, provides elemental compositions for ions with m/z up to 600, based on incontestable properties of atoms, their exact masses, isotopic abundances, and valences. In this study, MPPSIRD and a PGM were used to identify intended and unintended products resulting from attempted syntheses of 2 thermolabile, nonionic, phosphorothioate compounds. The products were volatilized from a probe inserted into a VG70-250SE double-focusing mass spectrometer. High mass resolution substituted separation in the mass domain for the temporal separation of most components provided by chromatographic techniques. MPPSIRD and the PGM identified the correct composition for M+• by rejecting all other compositions that were possible within the error limits of the exact mass determinations for M+• MPPSIRD was used with 10 000-24 000 resolution to determine exact masses of ions prominent in mass spectra and to isolate signals from different ions with the same nominal mass. Superposition of volatilization peaks of ions and linked scans (constant magnetic field to electrostatic sector voltage ratio) correlated fragment ions with the molecular ion. The PGM determined the compositions of fragment ions, using the number of atoms of each element in the molecular ion as limits. Fragmentation schemes based on these ions and the tables of exact masses and relative abundances provided a preponderance of evidence for the product identities.

Mass Peak Profiling from Selected-Ion Recording Data as a Tool for Regulatory Analyses