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The ability to uniquely identify an object or device is important forauthentication. Imperfections, locked into structures during fabrication, canbe used to provide a fingerprint that is challenging to reproduce. In thispaper, we propose a simple optical technique to read unique information fromnanometer-scale defects in 2D materials. Flaws created during crystal growth orfabrication lead to spatial variations in the bandgap of 2D materials that canbe characterized through photoluminescence measurements. We show a simple setupinvolving an angle-adjustable transmission filter, simple optics and a CCDcamera can capture spatially-dependent photoluminescence to produce complexmaps of unique information from 2D monolayers. Atomic force microscopy is usedto verify the origin of the optical signature measured, demonstrating that itresults from nanometer-scale imperfections. This solution to opticalidentification with 2D materials could be employed as a robust security measureto prevent counterfeiting.

Optical identification using imperfections in 2D materials