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A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ~3 mJ/cm 2 infrared femtosecond laser and analyzed with timeresolved Xray diffraction (XRD) performed on an inair tabletop designed for an extremely short pulsed Xray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4%-5% in the time scale of ~200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.

Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer