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In this research, the effect of Samarium Oxide (Sm) doped (mol%) NiO as a dopant and added (wt%) in NiO as ceramic composite were investigated. The comparison of both doped and added ceramic in their dielectric properties was studied. Both electroceramic Ni(1x)SmxO and NiSmO3 were prepared by using a solid-state reaction method. Samarium was added with five different concentrations, which are 0.01, 0.02, 0.03, 0.05, and 0.10 mol% for dopant and another five different concentrations which are 1, 2, 3, 4, and 5 wt% for addition in NiO. The XRD results show that both ceramic doped and added samples did not change the NiO cubic structure. Besides, a high concentration of Sm 3+ causes the lattice parameter of NiO to increase. The dielectric behavior was observed in a frequency range of 100 to 100 000 Hz. The optimum composition for Ni(1-x)SmxO and NiSmO3 was obtained at x = 0.01 mol% and 5.0 wt% sample with highest εo (2.4 x 10 4 and 9.3 x 10 4 ) respectively but at the same time, they exhibit high dielectric loss (tan δ) with value 4.9 and 10.5 respectively.

The Comparison between Samarium Doped Nickel Oxide and Samarium Added Nickel Oxide on Dielectric Properties