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The use of efficient wavelength-shifters from the vacuum-ultraviolet to thephotosensor's range of sensitivity is a key feature in detectors for DarkMatter search and neutrino physics based on liquid argon scintillationdetection. Thin film of Tetraphenyl-butadiene (TPB) deposited onto the surfacedelimiting the active volume of the detector and/or onto the photosensoroptical window is the most common solution in current and planned experiments.Detector design and response can be evaluated and correctly simulated only whenthe properties of the optical system in use (TPB film + substrate) are fullyunderstood. Characterization of the optical system requires specific, sometimessophisticated optical methodologies. In this paper the main features of TPBcoatings on different, commonly used substrates is reported, as a result of twoindependent campaigns of measurements at the specialized optical metrology labsof ENEA and University of Tor Vergata. Measured features include TPB emissionspectra with lineshape and relative intensity variation recorded as a functionof the film thickness and for the first time down to LAr temperature, as wellas optical reflectance and transmittance spectra of the TPB coated substratesin the wavelength range of the TPB emission.

VUV-Vis optical characterization of Tetraphenyl-butadiene films on glass and specular reflector substrates from room to liquid Argon temperature