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The Young-Feynman two-slit experiment for single electrons has been carried out\udby inserting in a conventional transmission electron microscope two nanometric slits and a fast\udrecording system able to measure the electron arrival-time. The detector, designed for experiments\udin future colliders, is based on a custom CMOS chip of 4096 monolithic active pixels equipped\udwith a fast readout chain able to manage up to 106 frames per second. In this way, high statistic\udsamples of single electron events can be collected within a time interval short enough to guarantee\udthe stability of the system and coherence conditions of the illumination. For the first time in a single\udelectron two-slit experiment, the time distribution of electron arrivals has been measured

Application of a HEPE-oriented 4096-MAPS to time analysis of single electron distribution in a two-slits interference experiment