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In the past years, it has been observed at several beam test campaigns thatirradiated LGAD sensors break with a typical star shaped burn mark whenoperated at voltages much lower than those at which they were safely operatedduring laboratory tests. The study presented in this paper was designed todetermine the safe operating voltage that these sensors can withstand. Manyirradiated sensors from various producers were tested in two test beamfacilities, DESY (Hamburg) and CERN-SPS (Geneva), as part of ATLAS HighGranularity Timing Detector (HGTD) beam tests. The samples were placed in thebeam and kept under bias over a long period of time in order to reach a highnumber of particles crossing each sensor. Both beam tests lead to a similarconclusion, that these destructive events begin to occur when the averageelectric field in the sensor becomes larger than 12 Volts per micrometre.

Destructive breakdown studies of irradiated LGADs at beam tests for the ATLAS HGTD