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We have measured the properties of scintillation light in liquid argon dopedwith xenon concentrations from 165 ppm to 10,010 ppm using a $^{22}$Na source.The energy transfer processes in the xenon-doped liquid argon are discussed indetail, and a new waveform model is established and used to fit the averagewaveform. The time profile of the scintillation photon in the xenon-dopedliquid argon and of the TPB emission are presented. The quantities ofxenon-doped are controlled by a Mass Flow Controller which is calibrated via aRedusial Gas Analyzer to ensure that the xenon concentration is accurate. Inaddition, a successful test of $^{83{\rm m}}$Kr as a calibration source hasbeen implemented in the xenon-doped liquid argon detector for the first time.By comparing the light yield of the $^{22}$Na and $^{83{\rm m}}$Kr, it can beconcluded that the scintillation efficiency is almost same over the range of41.5 keV to 511 keV.

Using $^{22}$Na and $^{83{\rm m}}$Kr to calibrate and study the properties of scintillation in xenon-doped liquid argon