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Understanding reflective properties of materials and photodetectionefficiency (PDE) of photodetectors is important for optimizing energyresolution and sensitivity of the next generation neutrinoless double betadecay, direct detection dark matter, and neutrino oscillation experiments thatwill use noble liquid gases, such as nEXO, DARWIN, DarkSide-20k, and DUNE.Little information is currently available about reflectivity and PDE in liquidnoble gases, because such measurements are difficult to conduct in a cryogenicenvironment and at short enough wavelengths. Here we report a measurement ofspecular reflectivity and relative PDE of Hamamatsu VUV4 siliconphotomultipliers (SiPMs) with 50 micrometer micro-cells conducted with xenonscintillation light (~175 nm) in liquid xenon. The specular reflectivity at 15deg. incidence of three samples of VUV4 SiPMs is found to be 30.4+/-1.4%,28.6+/-1.3%, and 28.0+/-1.3%, respectively. The PDE at normal incidence differsby +/-8% (standard deviation) among the three devices. The angular dependenceof the reflectivity and PDE was also measured for one of the SiPMs. Both thereflectivity and PDE decrease as the angle of incidence increases. This is thefirst measurement of an angular dependence of PDE and reflectivity of a SiPM inliquid xenon.

Reflectivity and PDE of VUV4 Hamamatsu SiPMs in Liquid Xenon