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Charging-up processes affecting gain stability in Thick Gas ElectronMultipliers (THGEM) were studied with a dedicated simulation toolkit.Integrated with Garfield++, it provides an effective platform for systematicphenomenological studies of charging-up processes in MPGD detectors. Wedescribe the simulation tool and the fine-tuning of the step-size required forthe algorithm convergence, in relation to physical parameters. Simulationresults of gain stability over time in THGEM detectors are presented, exploringthe role of electrode-thickness and applied voltage on its evolution. Theresults show that the total amount of irradiated charge through electrode'shole needed for reaching gain stabilization is in the range of tens to hundredsof pC, depending on the detector geometry and operational voltage. Theseresults are in agreement with experimental observations presented previously.

Simulation of gain stability of THGEM gas-avalanche particle detectors