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We characterize the astrometric distortion at the edges of thick,fully-depleted CCDs in the lab using a bench-top simulation of LSST observing.By illuminating an array of forty thousand pinholes (30mu m diameter) at theobject plane of a f/1.2 optical reimager, thousands of PSFs can be imaged overa 4Kx4K pixel CCD. Each high purity silicon pixel, 10mu m square by 100mu mdeep, can then be individually characterized through a series of sub-pixeldithers in the X/Y plane. The unique character [response, position, shape] ofeach pixel as a function of flux, wavelength, back side bias, etc. can beinvestigated. We measure the magnitude and onset of astrometric error at theedges of the detector as a test of the experimental setup, using a LSSTprototype CCD. We show that this astrometric error at the edge is sourced fromnon-uniformities in the electric field lines that define pixel boundaries. Thisedge distortion must be corrected in order to optimize the science output ofweak gravitational lensing and large scale structure measurements for the LSST.

Mapping charge transport effects in thick CCDs with a dithered array of 40,000 stars