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We have recently found in insulating granular Al thin film a new experimentalfeature (Delahaye et al., Phys. Rev. Lett. 106, 186602, 2011), namely theexistence of a conductance relaxation that is not sensitive to gate voltagechanges. This conductance relaxation is related to the existence of ametallic-like screening in the film and can be used to estimate itscharacteristic length scale. In the present paper, we give some experimentaldetails on how this feature was measured and present our first results on thescreening length temperature dependence.

Screening and conductance relaxations in insulating granular aluminium thin films