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Fluoropolymer brush with crystalline side chains was prepared by surface-initiated atom transfer radical polymerization of 2-(perfluorooctyl)ethyl acrylate (FA-C8) from a flat silicon substrate. The crystallization and the molecular aggregation structures of polymer side chain at the outermost surface and internal region in the brush film were characterized by grazing incidence X-ray diffraction (GIXD) measurement using two different incident angles of X-ray. At the air interface of PFA-C8 brush film, the rod-like Rf group was oriented perpendicular to the surface forming a hexagonal packing structure to reduce surface energy. In contrast, the oriented Rf groups parallel to the substrate coexisted at the internal region in the brush. This unique depth dependence of crystalline state of the fluoropolymer brush was observed by surface-sensitive GIXD measurement.

Molecular aggregation states of poly{2-(perfluorooctyl)ethyl acrylate} polymer brush thin film analyzed by grazing incidence X-ray diffraction