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We report on the detection by means of Raman spectroscopy of amorphousberyllium deuteride, BeD 2 , in magnetron sputtered deposits synthesized in twodifferent laboratories and containing about 20 at.% of deuterium. In contrast,this signature has not been found for the JET limiter samples studied comingfrom the inner, outer or upper limiters, even when coming from a depositionzone of the limiters. We give a way to disentangle that BeD 2 signature fromother signatures falling in the same spectroscopic range and mainly related toother phenomena. We also analyze the Raman characteristics of the JET sampledefects. These results could help in the interpretation of D thermal desorptionspectra and in future analyses of JET thick Be deposit divertor tiles.

D retention and material defects probed using Raman microscopy in JET limiter samples and beryllium-based synthesized samples