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Scanning probe microscopy (SPM) is a fundamental technique for the analysisof surfaces. In the present work, the interface statistics of surfaces scannedwith a probe tip was analyzed for both \textit{in silico} and experimentalsystems that \textit{do not} belong to the prominent Kardar-Parisi-Zhang (KPZ)universality class. We show that height, local roughness and extremal heightdistributions of scanned surfaces quantitatively agree with the KPZ class in arange similar or better than recent experimental evidences of the KPZ classusing SPM images. The underlying mechanism behind this artificial KPZ class isthe finite size of the probe tip, which does not permit a full resolution ofneither deep valleys or sloping borders of plateaus. The net result is ascanned profile laterally thicker and higher than the original one implying anexcess growth, the major characteristic of the KPZ universality class. Theactual universality class of self-affine scanned surfaces are expected at longtimes when the characteristic surface lengths become much larger than those ofthe probe tip but our finds can be of relevance to experiments wheresufficiently long growth times cannot be easily achieved. We also propose thatthe KPZ signatures can be also elicited in mounded surfaces with high aspectratio due to the interaction with the bulk of the probe tip. Strategies toprevent false positives of the KPZ class are discussed.

Hallmarks of the Kardar-Parisi-Zhang universality class elicited by scanning probe microscopy