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Using focused electron-beam-induced deposition (FEBID), we fabricatevertical, platinum-coated cobalt nanowires with a controlled three-dimensionalstructure. The latter is engineered to feature bends along the height: theseare used as pinning sites for domain walls, the presence of which weinvestigate using X-ray Magnetic Circular Dichroism (XMCD) coupled toPhotoEmission Electron Microscopy (PEEM). The vertical geometry of our samplecombined with the low incidence of the X-ray beam produce an extended wireshadow which we use to recover the wire's magnetic configuration. In thistransmission configuration, the whole sample volume is probed, thuscircumventing the limitation of PEEM to surfaces. This article reports on thefirst study of magnetic nanostructures standing perpendicular to the substratewith XMCD-PEEM. The use of this technique in shadow mode enabled us to confirmthe presence of a domain wall (DW) without direct imaging of the nanowire.

Transmission XMCD-PEEM imaging of an engineered vertical FEBID cobalt nanowire with a domain wall