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Quadriwave lateral shearing interferometry (QLSI) is a quantitative phaseimaging technique based on the use of a diffraction grating placed in front ofa camera. This grating creates a wire-mesh-like image, called an interferogram,that is postprocessed to retrieve both the intensity and phase profiles of anincoming light beam. Invented in the 90s, QLSI has been used in numerousapplications, e.g., laser beam characterization, lens metrology, topographymeasurements, adaptive optics, or gas jet metrology. More recently, thetechnique has been implemented on optical microscopes to characterize micro andnano-objects for bioimaging and nanophotonics applications. However, not mucheffort has been placed on disseminating this powerful technology so far, whileit is yet a particularly simple technique. In this article, we intend topopularize this technique by describing all its facets in the framework ofoptical microscopy, namely the working principle, its implementation on amicroscope and the theory of image formation, using simple pictures. Also, weprovide and comment an algorithm of interferogram processing, written inMatlab. Then, following the new extension of the technique for microscopy andnanophotonics applications, and the deviation from what the technique wasinitially invented for, we propose to revisit the description of the technique,in particular by discussing the terminology, insisting more on a grating-shadowdescription rather than a quadriwave process, and proposing an alternativeappellation, namely "grating shadow phase microscopy" or "grating-assistedphase imaging".

journal of physics. d, applied physics

Quantitative phase microscopy using quadriwave lateral shearing  interferometry (QLSI): principle, terminology, algorithm and grating shadow  description