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X-ray resonant magnetic reflectivity (XRMR) is a powerful method to determinethe optical, structural and magnetic depth profiles of a variety of thin films.Here, we investigate samples of different complexity all measured at the PtL$_3$ absorption edge to determine the optimal procedure for the analysis ofthe experimental XRMR curves, especially for nontrivial bi- and multilayersamples that include differently bonded Pt from layer to layer. The softwaretool ReMagX is used to fit these data and model the magnetooptic depth profilesbased on a highly adaptable layer stack which is modified to be a more preciseand physically consistent representation of the real multilayer system. Variousfitting algorithms, iterative optimization approaches and a detailed analysisof the asymmetry ratio features as well as $\chi^2$ (goodness of fit)landscapes are utilized to improve the agreement between measurements andsimulations. We present a step-by-step analysis procedure tailored to the Ptthin film systems to take advantage of the excellent magnetic sensitivity anddepth resolution of XRMR.

Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity