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We show here that the morphological pathway of spontaneous dewetting ofultrathin Ag films on SiO2 under nanosecond laser melting is found to be filmthickness dependent. For films with thickness h between 2 <= h <= 9.5 nm, themorphology during the intermediate stages of dewetting consisted ofbicontinuous structures. For films 11.5 <= h <= 20 nm, the intermediate stagesconsisted of regularly-sized holes. Measurement of the characteristic lengthscales for different stages of dewetting as a function of film thickness showeda systematic increase, which is consistent with the spinodal dewettinginstability over the entire thickness range investigated. This change inmorphology with thickness is consistent with observations made previously forpolymer films [A. Sharma et al, Phys. Rev. Lett., v81, pp3463 (1998); R.Seemann et al, J. Phys. Cond. Matt., v13, pp4925, (2001)]. Based on thebehavior of free energy curvature that incorporates intermolecular forces, wehave estimated the morphological transition thickness for the intermolecularforces for Ag on SiO2 . The theory predictions agree well with observations forAg. These results show that it is possible to form a variety of complex Agnanomorphologies in a consistent manner, which could be useful in opticalapplications of Ag surfaces, such as in surface enhanced Raman sensing.

Thickness-dependent spontaneous dewetting morphology of ultrathin Ag films