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Mapping energy transformation pathways and dissipation on the nanoscale andunderstanding the role of local structure on dissipative behavior is achallenge for imaging in areas ranging from electronics and informationtechnologies to efficient energy production. Here we develop a novel ScanningProbe Microscopy (SPM) technique in which the cantilever is excited and theresponse is recorded over a band of frequencies simultaneously rather than at asingle frequency as in conventional SPMs. This band excitation (BE) SPM allowsvery rapid acquisition of the full frequency response at each point (i.e.transfer function) in an image and in particular enables the direct measurementof energy dissipation through the determination of the Q-factor of thecantilever-sample system. The BE method is demonstrated for force-distance andvoltage spectroscopies and for magnetic dissipation imaging with sensitivityclose to the thermomechanical limit. The applicability of BE for various SPMsis analyzed, and the method is expected to be universally applicable to allambient and liquid SPMs.

The Band Excitation Method in Scanning Probe Microscopy for Rapid Mapping of Energy Dissipation on the Nanoscale