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We find that the jump-into-contact of the cantilever in the atomic forcemicroscope (AFM) is caused by an inherent instability in the motion of the AFMcantilever. The analysis is based on a simple model of the cantilever moving ina nonlinear force field. We show that the jump-into-contact distance can beused to find the interaction of the cantilever tip with the surface. In thespecific context of the attractive van der Waals interaction, this method canbe realized as a new method of measuring the Hamaker constant for materials.The Hamaker constant is determined from the deflection of the cantilever at thejump-into-contact using the force constant of the cantilever and the tip radiusof curvature, all of which can be obtained by measurements. The results havebeen verified experimentally on a sample of cleaved mica, a sample of Si waferwith natural oxide and a silver film, using a number of cantilevers withdifferent spring constants. We emphasize that the method described here isapplicable only to surfaces that have van der Waals interaction as thetip-sample interaction. We also find that the tip to sample separation at thejump-into-contact is simply related to the cantilever deflection at this point,and this provides a method to exactly locate the surface.

A method to quantitatively evaluate Hamaker constant using the jump-into-contact effect in Atomic Force microscopy